V1−xWxO2 thermochromic films for device applications

Abstract V 1− x W O 2 is known to be a reliable thermochromic material for multiple practical applications due its insulator metal transition temperature controlled by dopping. In this paper, we present electrical and optical properties of thin films synthesized PLD technique. respect, the resistance, refractive index ( n ), extinction coefficient k ) as function from 25 80 °C wavelength ranging 500 3000 nm were obtained using conventional 4-probe resistance ellipsometry methods. The direct indirect bandgap values at different doping levels temperatures have been calculated versus energy data compared with thermally activated resistance. A decrease in bandgaps was observed temperature. Comparison between thermal demonstrates that only comparable lowest bandgap. Graphical abstract